Switzerland
based IR Microsystems, a leader
in compact, tunable laser diode based gas sensors for monitoring, safety and
process control, presents an innovative sub-ppm ammonia gas detector, which can
be seen live at PITTCON 2008 (USA, March 3rd 6th, 2008, Booth 6842), Hannover
Messe 2008 (Germany, April 21st 25th, 2008, Booth D34, Hall 15) and Sensor +
Test 2008 (Germany, May 6th-8th, 2008, Booth 7-310).
The drift-free detector shows an excellent RMS noise of only 0.15 ppm, with
perfect linearity up to 1000 ppm. The sensors are targeted toward applications
in industrial safety, refrigeration, emission control, livefe-stock farming and
agriculture, and are offered as stand-alone systems or OEM sub-mounts for the
continuous monitoring of NH3 and other gases like O2, CO2, CH4, H2O, etc.
Compared to current gas sensor technologies, IR Microsystems Next
Generation Gas Detection products feature exceptional advantages like
extremely high selectivity, calibration-free operation, low-cost-of-ownership,
and functional safety.
The patented measurement
principle is based on Tunable Diode Laser Spectrometry (TDLS) and results in
unique products without a reference channel, allowing for simpler, lower-cost
systems. According to the companys press release, the sensor comprises a
microprocessor-driven read-out module with digital and analog data outputs for
industry-standard connectivity (I2C-bus, RS485, RS232, or 4-20 mA). The unit is
built ready-to-use for rapid OEM integration into stand-alone units, detector
networks or explosion-proof housings.