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Monday, 11 February 2008

Switzerland based IR Microsystems, a leader in compact, tunable laser diode based gas sensors for monitoring, safety and process control, presents an innovative sub-ppm ammonia gas detector, which can be seen live at PITTCON 2008 (USA, March 3rd– 6th, 2008, Booth 6842), Hannover Messe 2008 (Germany, April 21st – 25th, 2008, Booth D34, Hall 15) and Sensor + Test 2008 (Germany, May 6th-8th, 2008, Booth 7-310).


ir microsystems The drift-free detector shows an excellent RMS noise of only 0.15 ppm, with perfect linearity up to 1000 ppm. The sensors are targeted toward applications in industrial safety, refrigeration, emission control, livefe-stock farming and agriculture, and are offered as stand-alone systems or OEM sub-mounts for the continuous monitoring of NH3 and other gases like O2, CO2, CH4, H2O, etc. Compared to current gas sensor technologies, IR Microsystems’ “Next Generation Gas Detection” products feature exceptional advantages like extremely high selectivity, calibration-free operation, low-cost-of-ownership, and functional safety.


The patented measurement principle is based on Tunable Diode Laser Spectrometry (TDLS) and results in unique products without a reference channel, allowing for simpler, lower-cost systems. According to the company’s press release, the sensor comprises a microprocessor-driven read-out module with digital and analog data outputs for industry-standard connectivity (I2C-bus, RS485, RS232, or 4-20 mA). The unit is built ready-to-use for rapid OEM integration into stand-alone units, detector networks or explosion-proof housings.




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